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JEDEC JESD398 (R2009)
- MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE
- standard by JEDEC Solid State Technology Association, 07/01/1972
- Publisher: JEDEC
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This standard contains a three-terminal procedure for capacitance measurement with due precautions for shielding of extraneous effects due to terminal leads and metal enclosures. Formerly known as RS-398 and/or EIA-398