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JEDEC JESD340 (R2009)
- STANDARD FOR THE MEASUREMENT OF CRE
- standard by JEDEC Solid State Technology Association, 11/01/1967
- Publisher: JEDEC
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This standard offers an easily measured parameter which is one of the significant characteristics in determining the stability of a transistor intended for small-signal operation. The measurement technique allows rapid testing. Its correlation to AC stability will help to establish the interchangeability of a device. Formerly known as RS-340 and/or EIA-340.
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