Provide PDF Format
JEDEC JEP121A
- REQUIREMENTS FOR MICROELECTRONIC SCREENING AND TEST OPTIMIZATION
- standard by JEDEC Solid State Technology Association, 10/01/2006
- Publisher: JEDEC
$38.00$76.00
The purpose of this document provides the basis for the optimization of 100% screening/stress operations and sample inspection test activities. This document is designed to assist the manufacturer in optimizing the test flow while maintaining and/or improving assurance of providing high quality and reliable product in an efficient manner. This will allow for optimization of testing that is not adding value, hence, reducing cycle time and costs.
Related Products
JEDEC JESD8-3A
ADDENDUM No. 3A to JESD8 - GUNNING TRANSCEIVER LOGIC (GTL) LOW-LEVEL, HIGH-SPEED INTERFACE STANDARD ..
$26.00 $51.00
JEDEC JESD 22-A117B
ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST..
$31.00 $62.00