Provide PDF Format
JEDEC JEP 122F
- FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES
- standard by JEDEC Solid State Technology Association, 11/01/2010
- Publisher: JEDEC
$71.00$141.00
This publication provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations when the only available data is based on tests performed at accelerated stress test conditions. The method to be used is the Sum of the Failure Rates method.
Related Products
JEDEC JESD24-12
THERMAL IMPEDANCE MEASUREMENT FOR INSULATED GATE BIPOLAR TRANSISTORS - (Delta VCE(on) Method)..
$28.00 $56.00
JEDEC JESD 24-3
ADDENDUM No. 3 to JESD24 - THERMAL IMPEDANCE MEASUREMENTS FOR VERTICAL POWER MOSFETS (DELTA SOURCE-D..
$30.00 $59.00