• JEDEC JESD 381-A (R2002)
Provide PDF Format

Learn More

JEDEC JESD 381-A (R2002)

  • METHOD OF DIODE Q MEASUREMENT
  • standard by JEDEC Solid State Technology Association, 11/01/1981
  • Publisher: JEDEC

$30.00$60.00


This standard was updated and revised for the purpose of clarifying the method used to measure Q of a Voltage-Variable-Capacitance Diode in the low VHF range using an RF admittance bridge. Originally published November 1981. Approved as ANSI/EIA-381-A-1992, July 1992. Became JESD381-A after ANSI expiration July 2002.

Related Products

JEDEC JEP110

JEDEC JEP110

GUIDELINES FOR THE MEASUREMENT OF THERMAL RESISTANCE OF GaAs FETS..

$27.00 $54.00

JEDEC JEP84A

JEDEC JEP84A

RECOMMENDED PRACTICE FOR MEASUREMENT OF TRANSISTOR LEAD TEMPERATURE..

$24.00 $48.00

JEDEC JESD82-17

JEDEC JESD82-17

DEFINITION OF THE SSTUA32S868 AND SSTUA32D868 REGISTERED BUFFER WITH PARITY FOR 2R X 4 DDR2 RDIMM AP..

$37.00 $74.00

JEDEC JESD82-8.01

JEDEC JESD82-8.01

STANDARD FOR DEFINITION OF CU877 PLL CLOCK DRIVER FOR REGISTERED DDR2 DIMM APPLICATIONS..

$30.00 $60.00