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JEDEC JEB 15

TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS
standard by JEDEC Solid State Technology Association, 11/01/1969
Publisher: JEDEC

$71.00$141.00

Description

This bulletin explains the terminology and methods of measurement for bistable semiconductor microcircuits. It is also intended to be used with the EIA Registration Data Format for semiconductor integrated bistable logic circuits.

Product Details

Published:: 11/01/1969
Number of Pages:: 97
File Size:: 1 file

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