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ESD S5.3.1-2009
- Charged Device Model (CDM) -- Component Level
- standard by Electrostatic Discharge Association, 2009
- Publisher: ESD
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Establishes the procedure for testing, evaluating and classifying the ESD sensitivity of components to the defined CDM.
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ESD TR5.4-02-08
Determination of CMOS Latch-up Susceptibility, Transient Induced Latch-Up - Technical Report No. 2..
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