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JEDEC EIA 323 (R2002)
- AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES
- standard by JEDEC Solid State Technology Association, 03/01/1966
- Publisher: JEDEC
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This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device.
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